Global Failure Analysis Equipment Market

Global Failure Analysis Equipment Market Size, Share, Growth Analysis, By Equipment Type(Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM)), By Technology(Broad Ion Milling (BIM) Technology, Secondary) - Industry Forecast 2024-2031

Report ID: SQMIG45A2279 | Region: Global | Published Date: April, 2024
Pages: 197 | Tables: 67 | Figures: 72

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Global Failure Analysis Equipment Market size was valued at USD 1.3 Billion in 2022 and is poised to grow from USD 3.08 Billion in 2023 to USD 4.38 Billion by 2031, growing at a CAGR of 4.5% in the forecast period (2024-2031).

The competitive environment of the Global Failure Analysis Equipment Market is dynamic and characterized by the presence of a mix of well-established brands, emerging players, and niche producers. Leading failure detection equipment manufacturers include Veeco Instruments, Carl Zeiss SMT GmbH, Bruker Corporation, Oxford Instruments, JEOL Limited, Eurofins Sciences, Thermo Fisher Sciences, A&D Co., Ltd., Hitachi Hi-Technologies Europe GmbH and Tescon Orsay Holding. These players are constantly introducing new tools to meet the needs of the end users. This is followed by strategies such as mergers, acquisitions and plant expansions. 'Hitachi High-Technologies Corporation (Japan)', 'Carl Zeiss (Germany)', 'JOEL, Ltd. (Japan)', 'TESCAN OSRAY HOLDING (Czech Republic)', 'Semilab (Hungary)', 'A&D Company, Ltd. (Japan)', 'HORIBA, Ltd. (Japan)', 'Leica Microsystems GmbH (Germany)', 'Oxford Instruments (UK)', 'Eurofins Scientific (Luxembourg)', 'Thermo Fisher Scientific', 'Keysight Technologies', 'Oxford Instruments', 'FEI Company', 'Bruker Corporation', 'Nikon Instrument', 'Zetec Inc.'

Correlated light and electron microscopy (CLEM) combines two microscopy platforms, electron microscopy and light microscopy. Light microscopy provides 3D quantitative and analytical data with a focus on live cell analysis. However, for ultrastructure and protein labeling, only electron microscopy provides the highest resolution. Furthermore, EM provides high-resolution images but only in specific areas of the abiotic cell. LM can provide a broad picture of living and nonliving cells, despite its limited range. CLEM thus allows scientists to view and magnify cells throughout the cell. Furthermore, CLEM techniques provide a new tool for quantitative 3D analysis by adding a third dimension to EM by combining electron tomography with fast freezing.

Establishment of Safety Rules and Regulations by Governments and International Organizations: Failure analysis techniques are used to identify faults and deficiencies in existing equipment and improved equipment/devices used in various industries. Government safety regulations and stringent quality control requirements increase the demand for failure analysis tools. Countries have regulatory bodies that review, develop and publish industrial and technical standards. For example, the American Society for Nondestructive Testing (ASNT) is a membership-based, nonprofit professional association involved in NDT-related products.

North America dominated the global market. Manufacturers of failure detection devices in the North America region include Thermo Fisher Scientific Inc.; (U.S.), Motion X Corporation (U.S.), FEI Company (U.S.), and EAG Inc. (U.S.). (U.S.) adopting FIB technology for their analysis. Increase in the number of laboratories and the presence of key players involved in the development, distribution and use of FIB systems is driving the global failure analysis equipment market. It is expected that the U.S. will contribute significant share to the market in North America during the forecast period owing to technological advancements in semiconductor raw materials analysis methods and willingness of semiconductor component manufacturers to innovate their products and adopt new technologies because of the atom.

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